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Spectral analysis on the light reflection for measuring nanostructure of the myelinated axon
Spectral analysis on the light reflection for measuring nanostructure of the myelinated axon
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机译:测量髓鞘轴突纳米结构的光反射光谱分析
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摘要
The present invention relates to a method for analyzing a nanostructure of a nerve axon forming a medullary sheath using a reflection spectroscopy, and a device used therein. More specifically, the present invention relates to a method for optically analyzing an optical structure of a nerve axon forming a medullary sheath through a reflection spectroscopy, which analyzes a spectrum of an optical signal reflected through an optical element by extracting an optical reflection signal from a focus through a confocal optical system. Therefore, the analysis method according to the present invention can track and observe physiological and pathological states of a nerve axon cell organelle. The method comprises the following steps of: sequentially converting light generated from a white light source into monochrome (S1); entering the monochromatic light in the step S1 into a specimen (S2); and detecting the reflected light generated from the specimen in the step S2 at an optical detector by passing through a scanner and an object lens and passing through a lens for a confocal observation and a pin hole through a beam splitter.
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