首页> 外国专利> Method for forming counterdoped semiconductor device comprising first epitaxial layer and second epitaxial layer formed over first epitaxial layer having conductivity type different than second epitaxial layer

Method for forming counterdoped semiconductor device comprising first epitaxial layer and second epitaxial layer formed over first epitaxial layer having conductivity type different than second epitaxial layer

机译:形成包括第一外延层和形成在具有不同于第二外延层的导电类型的第一外延层之上的第二外延层的反掺杂半导体器件的方法

摘要

A semiconductor device includes a first type region including a first conductivity type. The semiconductor device includes a second type region including a second conductivity type. The semiconductor device includes a third type region including a third conductivity type that is opposite the first conductivity type, the third type region covering the first type region. The semiconductor device includes a fourth type region including a fourth conductivity type that is opposite the second conductivity type, the fourth type region covering the second type region. The semiconductor device includes a channel region extending between the third type region and the fourth type region.
机译:半导体器件包括具有第一导电类型的第一类型区域。半导体器件包括具有第二导电类型的第二类型区域。半导体器件包括第三类型区域,该第三类型区域包括与第一导电类型相反的第三导电类型,第三类型区域覆盖第一类型区域。半导体器件包括第四类型区域,该第四类型区域包括与第二导电类型相反的第四导电类型,第四类型区域覆盖第二类型区域。半导体器件包括在第三类型区域和第四类型区域之间延伸的沟道区域。

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