首页> 外国专利> Distinguishing foreign surface features from native surface features

Distinguishing foreign surface features from native surface features

机译:区分外来表面特征与本机表面特征

摘要

Provided herein is an apparatus, including a photon emitter configured for sequentially emitting a first set of photons and a second set of photons onto a surface of an article. In addition, a photon detector array is configured to focus the first set of photons scattered from surface features of the article in a first focal plane. The photon detector array is further configured to focus the second set of photons scattered from surface features of the article in a second focal plane, wherein the first set of photons scattered is different from the second set of photons scattered. The photon detector array is further configured to provide information for distinguishing foreign surface features of the article from native surface features of the article.
机译:本文提供了一种装置,该装置包括光子发射器,该光子发射器被配置为将第一组光子和第二组光子顺序地发射到物品的表面上。另外,光子检测器阵列被配置成将从物品的表面特征散射的第一组光子聚焦在第一焦平面中。光子检测器阵列还被配置为将从物品的表面特征散射的第二组光子聚焦在第二焦平面中,其中,散射的第一组光子与散射的第二组光子不同。光子检测器阵列还被配置为提供用于将物品的异物表面特征与物品的自然表面特征区分开的信息。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号