首页> 外国专利> Systems and methods for eliminating measurement artifacts of external quantum efficiency of multi-junction solar cells

Systems and methods for eliminating measurement artifacts of external quantum efficiency of multi-junction solar cells

机译:消除多结太阳能电池外部量子效率的测量伪影的系统和方法

摘要

A pulsed voltage bias method and/or pulsed light bias method may be used to reduce, minimize, and/or eliminate external quantum efficiency measurement artifacts of multi-junction solar cells, for example artifacts caused by the shunt effect. In this manner, multi-junction solar cells may be designed and constructed with improved performance, efficiency, and the like.
机译:脉冲电压偏置方法和/或脉冲光偏置方法可以用于减少,最小化和/或消除多结太阳能电池的外部量子效率测量伪像,例如由分流效应引起的伪像。以这种方式,可以以改善的性能,效率等来设计和构造多结太阳能电池。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号