首页>
外国专利>
Systems and methods for eliminating measurement artifacts of external quantum efficiency of multi-junction solar cells
Systems and methods for eliminating measurement artifacts of external quantum efficiency of multi-junction solar cells
展开▼
机译:消除多结太阳能电池外部量子效率的测量伪影的系统和方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
A pulsed voltage bias method and/or pulsed light bias method may be used to reduce, minimize, and/or eliminate external quantum efficiency measurement artifacts of multi-junction solar cells, for example artifacts caused by the shunt effect. In this manner, multi-junction solar cells may be designed and constructed with improved performance, efficiency, and the like.
展开▼