首页> 外国专利> Method for doping an active Hall effect region of a Hall effect device and Hall effect device having a doped active Hall effect region

Method for doping an active Hall effect region of a Hall effect device and Hall effect device having a doped active Hall effect region

机译:掺杂霍尔效应器件的有源霍尔效应区的方法和具有掺杂的有源霍尔效应区的霍尔效应器件

摘要

Methods for doping an active Hall effect region of a Hall effect device in a semiconductor substrate, and Hall effect devices having a doped active Hall effect region are provided. A method includes forming a first doping profile of a first doping type in a first depth region of the active Hall effect region by means of a first implantation with a first implantation energy level, forming a second doping profile of the first doping type in a second depth region of the active Hall effect region by means of a second implantation with a second implantation energy level, and forming an overall doping profile of the active Hall effect region by annealing the semiconductor substrate with the active Hall effect region having the first and the second doping profile.
机译:提供了用于在半导体衬底中掺杂霍尔效应器件的有源霍尔效应区域的方法,以及具有掺杂的有源霍尔效应区域的霍尔效应器件。一种方法,包括:通过具有第一注入能级的第一注入,在有源霍尔效应区域的第一深度区域中形成第一掺杂类型的第一掺杂轮廓,在第二光刻胶中形成第一掺杂类型的第二掺杂轮廓。通过具有第二注入能级的第二次注入来形成有源霍尔效应区域的深度区域,并通过将具有第一和第二有源霍尔效应区域的半导体衬底退火来形成有源霍尔效应区域的整体掺杂轮廓掺杂轮廓。

著录项

  • 公开/公告号US9741925B2

    专利类型

  • 公开/公告日2017-08-22

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号US201615069370

  • 发明设计人 MARKUS ECKINGER;STEFAN KOLB;

    申请日2016-03-14

  • 分类号H01L43/14;H01L43/04;H01L43/06;G01R33/07;G01R33/00;

  • 国家 US

  • 入库时间 2022-08-21 13:45:10

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