首页> 外国专利> METHOD OF ANALYSIS OF COMPONENT IN SAMPLE, METHOD OF SPECIFIC ISOLATION OF COMPONENT IN SAMPLE, AND SAMPLE FOR MASS SPECTROMETRY

METHOD OF ANALYSIS OF COMPONENT IN SAMPLE, METHOD OF SPECIFIC ISOLATION OF COMPONENT IN SAMPLE, AND SAMPLE FOR MASS SPECTROMETRY

机译:样品中成分的分析方法,样品中成分的特定分离方法以及质谱法中的样品

摘要

A trace component in a sample is quickly and accurately analyzed using a small sample quantity without performing preprocessing such as concentration.;Trace components in a sample can be analyzed quickly and accurately using a small sample quantity and without preprocessing such as concentration, by a method for analyzing a component in a sample, the method including a step for irradiating a thermoplastic resin film internally containing the sample with ionizing laser light of a mass spectrometer.
机译:通过少量方法可以快速,准确地分析样品中的痕量成分,而无需进行诸如浓缩的预处理;可以通过少量方法快速,准确地分析样品中的痕量成分,而无需进行诸如浓度的预处理。为了分析样品中的成分,该方法包括以下步骤:用质谱仪的电离激光照射包含在样品内部的热塑性树脂膜。

著录项

  • 公开/公告号US2017082579A1

    专利类型

  • 公开/公告日2017-03-23

    原文格式PDF

  • 申请/专利号US201515311556

  • 发明设计人 MAKOTO SAWADA;

    申请日2015-05-12

  • 分类号G01N27/64;H01J49/16;

  • 国家 US

  • 入库时间 2022-08-21 13:48:58

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