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ATTENUATED TOTAL REFLECTION SPECTROSCOPIC ANALYSIS APPARATUS HAVING SPECIMEN CONTACT AREA MEASURING DEVICE, AND ATTENUATED TOTAL REFLECTION SPECTROSCOPIC ANALYSIS METHOD
ATTENUATED TOTAL REFLECTION SPECTROSCOPIC ANALYSIS APPARATUS HAVING SPECIMEN CONTACT AREA MEASURING DEVICE, AND ATTENUATED TOTAL REFLECTION SPECTROSCOPIC ANALYSIS METHOD
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机译：具样品接触面积测量装置的衰减全反射光谱分析仪及衰减全反射光谱分析方法
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摘要
Disclosed are an attenuated total reflection spectroscopic analysis apparatus having a specimen contact area measuring device, and an attenuated total reflection spectroscopic analysis method. The disclosed attenuated total reflection spectroscopic analysis apparatus comprises: an attenuated total reflection (ATR ) prism; a first light source which emits a first light on an inclined side surface of the ATR prism; a first light receiving unit which receives the first light which penetrates the ATR prism through total reflection, and exits through an other inclined side surface of the ATR prism; a second light source which emits a second light on the inclined side surface of the ATR prism; a second light receiving unit arranged to face a lower surface of the ATR prism, receiving the second light which exits the ATR prism through scattered reflection; and a calculation processing unit which receives an electric signal from the second light receiving unit, and calculates an area of a specimen which actually touches an upper surface of the ATR prism. According to the present invention, since a specimen touch area is directly measured using a separate optical source and light receiving unit, a concentration of an analyzed material corrected for an actual contact area between the ATR prism and the specimen is able to be measured.;COPYRIGHT KIPO 2016
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