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Methods and structures for preparing single crystal silicon wafers for use as substrates for epitaxial growth of crack-free gallium nitride FILMS and devices

机译:制备用作无裂纹氮化镓FILMS的外延生长衬底的单晶硅晶片的方法和结构及装置

摘要

This document describes the fabrication and use of ceramic stabilizing layer fabricated right on the product silicon wafer to facilitate its use as a substrate for fabrication of gallium nitride films. A ceramic layer is formed and then attached to a single crystal silicon substrate to form a composite silicon substrate that has coefficient of thermal expansion comparable with GaN. The composite silicon substrates prepared by this invention are uniquely suited for use as growth substrates for crack-free gallium nitride films, benefiting from compressive stresses produced by choosing a ceramic having a desired higher coefficient thermal expansion than those of silicon and gallium nitride.
机译:该文献描述了直接在产品硅晶片上制造的陶瓷稳定层的制造和使用,以促进其用作制造氮化镓膜的衬底。形成陶瓷层,然后将其附着到单晶硅衬底上,以形成具有与GaN相当的热膨胀系数的复合硅衬底。由本发明制备的复合硅衬底特别适合用作无裂纹氮化镓膜的生长衬底,这得益于通过选择具有比硅和氮化镓所需的热膨胀系数更高的所需的热膨胀系数的陶瓷而产生的压缩应力。

著录项

  • 公开/公告号US9337024B2

    专利类型

  • 公开/公告日2016-05-10

    原文格式PDF

  • 申请/专利权人 ANANDA H. KUMAR;

    申请/专利号US201414251634

  • 发明设计人 ANANDA H. KUMAR;

    申请日2014-04-13

  • 分类号H01L21/30;H01L21/46;H01L21/02;H01L29/04;H01L29/20;H01L33/00;

  • 国家 US

  • 入库时间 2022-08-21 14:28:14

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