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Dynamic static random access memory (SRAM) array characterization using an isolated bit-line
Dynamic static random access memory (SRAM) array characterization using an isolated bit-line
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机译:使用隔离位线的动态静态随机存取存储器(SRAM)阵列表征
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摘要
A sensor circuit is used to provide bit-cell read strength distribution of an SRAM array. A current-mirror circuit mirroring the bit-line current of an SRAM array is used to power the sensor circuit. A reference current representing nominal bit-cell read current is used as a reference. The current-mirror circuit senses the bit-line current. The current-mirror and the ring oscillator are not part of the bit-line read path.
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