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APPARATUS FOR PERFORMING A POWER LOSS TEST FOR A NON-VOLATILE MEMORY DEVICE AND METHOD OF PERFORMING A POWER LOSS TEST FOR A NON-VOLATILE MEMORY DEVICE
APPARATUS FOR PERFORMING A POWER LOSS TEST FOR A NON-VOLATILE MEMORY DEVICE AND METHOD OF PERFORMING A POWER LOSS TEST FOR A NON-VOLATILE MEMORY DEVICE
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机译：用于执行非易失性存储器的功率损耗测试的装置和用于执行非易失性存储器的功率损耗测试的方法
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摘要
The power loss test device of the nonvolatile memory device is inserted into the nonvolatile memory device to be tested in order to perform the power loss test on the nonvolatile memory device having at least one pin indicating the operation state of the internal NAND flash memories A test board unit having a socket, a test board unit for detecting an operation state of the internal NAND flash memories from the at least one pin, and supplying and stopping power supply necessary for the operation of the nonvolatile memory device, And a tester section for providing a predetermined write command to the non-volatile memory device and for performing a power loss test on the non-volatile memory device based on the supply and interruption of the power source.
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