首页> 外国专利> APPARATUS AND PROCESS FOR PARTICLE MASS CONCENTRATION MEASUREMENT AND USE OF AN APPARATUS FOR PARTICLE MASS CONCENTRATION MEASUREMENT

APPARATUS AND PROCESS FOR PARTICLE MASS CONCENTRATION MEASUREMENT AND USE OF AN APPARATUS FOR PARTICLE MASS CONCENTRATION MEASUREMENT

机译:颗粒物浓度测量的装置和过程以及颗粒物浓度测量的装置的使用

摘要

Apparatus (1) for particle mass concentration measurement, comprising passage (2) with inlet (3) and outlet (4) for guiding sample flow Q comprising particles (P, P*) with a nominal count median diameter of CMDnom, through apparatus (1), means (7,8) for electrically charging particles (P,P*) and means (16,17) for measuring the electrical current carried by said charged particles (12, 12*). Apparatus 1 is further comprises trapping means (13) for trapping essentially all free ions 11 and charged particles 12 having particle diameter smaller than trap cut-off diameter Dc.0, the cut-off diameter Dc.0 being the particle diameter above which penetration through the trapping means (13) essentially deviates from zero and means (15) for adjusting the trapping means (13) to adjust the trap cut-off diameter Dc.oto a value which is within CMDnom -50% - +100%.
机译:用于颗粒质量浓度测量的设备(1),包括带有入口(3)和出口(4)的通道(2),用于引导样品流Q,该样品流Q包含标称计数中值直径为CMD nom的颗粒(P,P *) 通过设备(1),为粒子(P,P *)充电的装置(7,8)和用于测量所述带电粒子(12、12 *)携带的电流的装置(16,17) 。装置1还包括捕集装置(13),用于捕集基本上所有自由离子11和带电粒子12,其粒径小于捕集截止直径Dc.0,即截止直径D 是大于其直径的值,在该直径上,通过捕集装置(13)的渗透率基本上偏离零,并且用于调节捕集装置(13)的装置(15)将捕集截止直径D co <​​/ Sub>调整为在CMD nom -50%-+ 100%范围内的值。

著录项

  • 公开/公告号EP2823284A1

    专利类型

  • 公开/公告日2015-01-14

    原文格式PDF

  • 申请/专利权人 PEGASOR OY;

    申请/专利号EP20130716020

  • 发明设计人 JANKA KAUKO;

    申请日2013-03-04

  • 分类号G01N15/06;G01N27/70;G01M15/10;

  • 国家 EP

  • 入库时间 2022-08-21 15:04:09

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