首页>
外国专利>
Integrated circuit with programmable logic analyzer, enhanced analyzing and debugging capabilities and method
Integrated circuit with programmable logic analyzer, enhanced analyzing and debugging capabilities and method
展开▼
机译：具有可编程逻辑分析仪的集成电路，增强的分析和调试功能及方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefor. In one embodiment, an integrated circuit includes a logic analyzer having a first input receiving a plurality of signals and an output for providing an indication of a detection, by the logic analyzer, of at least one trigger event; and a built in self test block having a first input for receiving one or more of the signals appearing at the first input of the logic analyzer, a second input coupled to the output of the logic analyzer for selectively enabling the BIST block, the BIST block generating and maintaining a signature based upon the first and second inputs thereof.
展开▼
