首页> 外国专利> Image inspection system and image inspection method for determining a threshold useable for defect detection in a scanned image based upon a reference image with an artificial defect

Image inspection system and image inspection method for determining a threshold useable for defect detection in a scanned image based upon a reference image with an artificial defect

机译:图像检查系统和图像检查方法,用于基于具有人工缺陷的参考图像来确定可用于扫描图像中的缺陷检测的阈值

摘要

An image inspection system for inspecting an image output on a recording medium includes an image forming unit to form a threshold setting image on the recording medium; an image scanner to scan the threshold setting image to generate a scanned image; an inspection reference image generator to generate an inspection reference image using data of the an output-target image; an image inspection unit to determine a defect in the scanned image based on a difference between the inspection reference image and the scanned image; and a threshold determiner to determine a threshold to be compared with the difference between the inspection reference image and the scanned image. The image inspection unit computes the difference between the scanned image and the inspection reference image. The threshold determiner determines a threshold to be compared with the difference between the scanned image and the inspection reference image.
机译:一种用于检查在记录介质上输出的图像的图像检查系统,包括:图像形成单元,用于在记录介质上形成阈值设置图像;以及图像扫描仪扫描阈值设置图像以生成扫描图像;检查参考图像生成器使用输出目标图像的数据生成检查参考图像;图像检查单元基于检查基准图像和扫描图像之间的差异来确定扫描图像中的缺陷;阈值确定器,用于确定要与检查参考图像和扫描图像之间的差异进行比较的阈值。图像检查单元计算扫描图像和检查参考图像之间的差异。阈值确定器确定要与扫描图像和检查参考图像之间的差异进行比较的阈值。

著录项

  • 公开/公告号US9077927B2

    专利类型

  • 公开/公告日2015-07-07

    原文格式PDF

  • 申请/专利权人 HIROMITSU MIYAGAWA;TADASHI KITAI;

    申请/专利号US201313952782

  • 发明设计人 TADASHI KITAI;HIROMITSU MIYAGAWA;

    申请日2013-07-29

  • 分类号H04N1/40;H04N1/00;

  • 国家 US

  • 入库时间 2022-08-21 15:17:27

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