首页> 外国专利> FOCUSING METHOD, MEASUREMENT METHOD, PRINCIPAL POINT DETECTION METHOD, FOCUSING DEVICE, MEASUREMENT DEVICE AND PRINCIPAL POINT DEVICE

FOCUSING METHOD, MEASUREMENT METHOD, PRINCIPAL POINT DETECTION METHOD, FOCUSING DEVICE, MEASUREMENT DEVICE AND PRINCIPAL POINT DEVICE

机译:聚焦方法,测量方法,主要点检测方法,聚焦装置,测量装置和主要点装置

摘要

PROBLEM TO BE SOLVED: To provide a focusing method that can focus on a sample even when the sample is clear and transparent and a surface shape of the sample is smooth.SOLUTION: A focusing method has: a step of preparing a microscope; a step of mounting a sample having a surface shape curved to the microscope; and a prescribed processing step. The prescribed step has the steps of: receiving light emitted from an observation optical system; obtaining an amount of light on the basis of light from a prescribed area of the received light; calculating a difference between the amount of light in the prescribed area and a reference amount of light or a rate therebetween; comparing the a calculation result with a threshold; and changing an interval between the sample and the observation optical system. In the preparation step, one part area of illumination light is shaded or dimmed, and the prescribed area is one area of the sample, and when the calculation result is less than the threshold, the prescribed processing step is ended.
机译:解决的问题:提供一种即使在样品是透明且透明的并且样品的表面形状光滑的情况下也可以聚焦在样品上的聚焦方法。将具有弯曲的表面形状的样品安装到显微镜的步骤;和规定的处理步骤。规定步骤具有以下步骤:接收从观察光学系统发出的光;以及根据来自接收光的指定区域的光获得光量;计算规定区域中的光量与参考光量或两者之间的比率之间的差;将计算结果与阈值进行比较;并改变样品和观察光学系统之间的间隔。在准备步骤中,照明光的一部分区域被阴影化或变暗,并且规定区域是样本的一个区域,并且当计算结果小于阈值时,规定处理步骤结束。

著录项

  • 公开/公告号JP2015158570A

    专利类型

  • 公开/公告日2015-09-03

    原文格式PDF

  • 申请/专利权人 OLYMPUS CORP;

    申请/专利号JP20140032843

  • 发明设计人 SUZUKI YOSHIMASA;KAJITANI KAZUO;

    申请日2014-02-24

  • 分类号G02B7/28;G02B7/36;G02B21;G01B11;

  • 国家 JP

  • 入库时间 2022-08-21 15:34:27

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