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A method for the calibration of measured values from high-frequency measurements performed on an automated testing device for measurement of a plurality of microwave components
A method for the calibration of measured values from high-frequency measurements performed on an automated testing device for measurement of a plurality of microwave components
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机译：一种用于在用于测量多个微波组件的自动测试设备上执行的高频测量中的测量值校准的方法
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摘要
The invention relates to a method for the calibration of measured values from high-frequency measurements performed on an automated testing device (100) for measurement of a plurality of microwave components (52) of test probes (10, 30) of the testing device at a defined contact positions to be contacted. According to the invention, the by changes in position of the test probes (10, 30) on each disturbance variables caused by a contact position on a stationary reference calibration calibration standard is based on a detected and the reflectance standard detected in such a disturbance variables compensated for by means of a deembedding-process.
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