首页> 外国专利> Diode testing device, particularly for examining power supply of direct current loads, has switching matrix for switching power supply diodes by pole of direct current load in locked state, and for connecting with measuring circuit

Diode testing device, particularly for examining power supply of direct current loads, has switching matrix for switching power supply diodes by pole of direct current load in locked state, and for connecting with measuring circuit

机译：二极管测试装置，特别是用于检查直流负载电源的二极管测试装置，具有用于在锁定状态下通过直流负载的极来切换电源二极管的开关矩阵，并与测量电路连接。

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摘要

The diode testing device (1) has a switching matrix (5) for switching the power supply diodes (2,3) by a pole (6,7) of a direct current (DC) load (4) in a locked state, and for electrically connecting with a measuring circuit (8). The measuring circuit is provided for examining the blocking function of the power supply diode electrically connected with the measuring circuit by switching matrix. A microcontroller unit (9) is provided for evaluating the measurement of the measuring circuit and for partial automatic examination of the power supply (17) of the DC loads by the power supply diodes. An independent claim is included for a method for checking the power supply of the direct current loads from the power supply diodes through the diode testing device.

机译：二极管测试装置（1）具有用于在锁定状态下通过直流（DC）负载（4）的极（6,7）来切换电源二极管（2,3）的切换矩阵（5），以及用于与测量电路（8）电连接。提供测量电路，用于检查通过开关矩阵与测量电路电连接的电源二极管的阻断功能。提供微控制器单元（9），用于评估测量电路的测量结果，并通过电源二极管部分自动检查直流负载的电源（17）。包括一种独立权利要求，该方法用于检查从电源二极管通过二极管测试装置的直流负载的电源。

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公开/公告号DE102012014835A1

专利类型
公开/公告日2014-01-30

原文格式PDF
申请/专利权人 KERNKRAFTWERKE LIPPE-EMS GMBH;
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申请/专利号DE20121014835
发明设计人 TUECHTER ACHIM;
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申请日2012-07-27
分类号G01R31/26;
国家 DE
入库时间 2022-08-21 15:37:59

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