首页> 外国专利> PHOTORESIST HAVING POSITIVE RESIST CHARACTERISTICS, PROCESS FOR PHOTOCHEMICAL STRUCTURING THEREOF, PROCESS FOR PREPARING SILANES AND SILICA (HETERO)POLY(CO)CONDENSATES HAVING POSITIVE RESIST CHARACTERISTICS AND SILICA (HETERO)POLY(CO)CONDENSATES

PHOTORESIST HAVING POSITIVE RESIST CHARACTERISTICS, PROCESS FOR PHOTOCHEMICAL STRUCTURING THEREOF, PROCESS FOR PREPARING SILANES AND SILICA (HETERO)POLY(CO)CONDENSATES HAVING POSITIVE RESIST CHARACTERISTICS AND SILICA (HETERO)POLY(CO)CONDENSATES

机译:具有正性的光致抗蚀剂,光化学结构的工艺,硅和二氧化硅(杂)多(CO)的制备过程具有正性的特性和二氧化硅(杂)多

摘要

The present invention relates to a specific heteropolymer, namely a silica (hetero)poly(co)condensate having positive resist characteristics, which is notable for polycondensation or copolycondensation of specifically modified silanes. The invention likewise relates to monomeric silanes from which the corresponding heteropolymers, i.e. the silica (hetero)poly(co)condensates, can be prepared. The inventive silica (hetero)poly(co)condensates are usable for a photoresist having positive resist characteristics. The invention additionally relates to corresponding processes for preparing both the silanes and the silica (hetero)poly(co)condensates, and to a process for photochemical structuring of the inventive photoresist based on the silica (hetero)poly(co)condensates.
机译:本发明涉及一种特定的杂聚物,即具有正抗蚀剂特性的二氧化硅(杂)聚(共)缩合物,其对于特定改性的硅烷的缩聚或共缩聚是值得注意的。本发明同样涉及单体硅烷,从中可以制备相应的杂聚物,即二氧化硅(杂)聚(共)缩合物。本发明的二氧化硅(杂)聚(共)缩合物可用于具有正抗蚀剂特性的光致抗蚀剂。本发明另外涉及用于制备硅烷和二氧化硅(杂)聚(共)缩合物的相应方法,并且涉及基于二氧化硅(杂)聚(共)缩合物的本发明光致抗蚀剂的光化学结构化方法。

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