首页> 外国专利> Method for detecting X-ray quantum generated in X-ray unit used in medical field, involves evaluating measurement signals which is produced for approximating specific position at which X-ray quantum interacts with X-ray detector

Method for detecting X-ray quantum generated in X-ray unit used in medical field, involves evaluating measurement signals which is produced for approximating specific position at which X-ray quantum interacts with X-ray detector

机译：检测在医学领域中使用的X射线单元中产生的X射线量子的方法，涉及评估测量信号，该测量信号用于近似估计X射线量子与X射线检测器相互作用的特定位置

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摘要

The method involves generating the measurement signal through the pixels within a predetermined time interval. The pixels are arranged in coherent clusters. An evaluation unit (6) is provided for evaluating the pixels generated measurement signals which is produced for approximating a specific position at which the X-ray quantum interacts with the multi-pixel X-ray detecting unit (4). An independent claim is included for a device for detecting X-ray quantum.

机译：该方法包括在预定时间间隔内通过像素生成测量信号。像素以相干簇的形式排列。提供评估单元（6），用于评估像素产生的测量信号，该信号被产生以近似于X射线量子与多像素X射线检测单元（4）相互作用的特定位置。包括用于检测X射线量子的设备的独立权利要求。

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公开/公告号DE102011075520A1

专利类型
公开/公告日2012-11-15

原文格式PDF
申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;
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申请/专利号DE20111075520
发明设计人 SCHULZ REINER FRANZ;SHANNEIK KAISS;
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申请日2011-05-09
分类号G01T1/29;G21K4/00;
国家 DE
入库时间 2022-08-21 16:22:25

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