首页> 外国专利> COMPOUND SEMICONDUCTOR DEVICE OPERATING IN A NORMALLY-OFF MODE WHILE OBTAINING GOOD CHARACTERISTICS AND A MANUFACTURING METHOD THEREOF

COMPOUND SEMICONDUCTOR DEVICE OPERATING IN A NORMALLY-OFF MODE WHILE OBTAINING GOOD CHARACTERISTICS AND A MANUFACTURING METHOD THEREOF

机译:具有良好特性的常态关闭模式下的复合半导体器件及其制造方法

摘要

PURPOSE: A compound semiconductor device and a manufacturing method thereof suppress the diffusion of two-dimensional electron gas below a gate electrode by forming an Fe-doped layer between a substrate and an electron travel layer in a region corresponding to the position of the gate electrode.;CONSTITUTION: An electron travel layer (15) and an electron supply layer (17) are formed above a substrate (11). A gate electrode (19g), a source electrode (19s), and a drain electrode (19d) are formed on the electron supply layer. An Fe-doped layer (14) is located between the substrate and the electron travel layer in a region corresponding to the position of the gate electrode. The Fe-doped layer suppresses two-dimensional electron gas (100) below the gate electrode. The Fe-doped layer is doped with Fe at a concentration of equal to or more than 1×10^17 cm^-3.;COPYRIGHT KIPO 2013
机译:用途:化合物半导体器件及其制造方法通过在基板和电子传输层之间的与栅电极位置相对应的区域中形成Fe掺杂层,抑制二维电子气在栅电极下方的扩散组成:在基板(11)上方形成电子传输层(15)和电子供给层(17)。在电子供给层上形成有栅电极(19g),源电极(19s)和漏电极(19d)。掺杂Fe的层(14)在与栅电极的位置相对应的区域中位于基板和电子传播层之间。掺杂Fe的层抑制了栅电极下方的二维电子气(100)。 Fe掺杂层中的Fe掺杂浓度等于或大于1×10 ^ 17 cm ^ -3。; COPYRIGHT KIPO 2013

著录项

  • 公开/公告号KR20130110044A

    专利类型

  • 公开/公告日2013-10-08

    原文格式PDF

  • 申请/专利权人 FUJITSU LIMITED;

    申请/专利号KR20130030166

  • 发明设计人 KAMADA YOUICHI;

    申请日2013-03-21

  • 分类号H01L29/778;H01L21/335;

  • 国家 KR

  • 入库时间 2022-08-21 16:26:11

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