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ELECTRONIC COMPONENT TEST DEVICE AND AN OPERATING METHOD THEREOF, CAPABLE OF BEING LOCKED UNTIL A PROXIMITY SENSOR SENSES PROXIMITY FROM A PERFORMANCE TEST COMPLETION WHEN AN ELECTRONIC PART IN WHICH A PERFORMANCE IS TESTED IS A DEFECTIVE PRODUCT
ELECTRONIC COMPONENT TEST DEVICE AND AN OPERATING METHOD THEREOF, CAPABLE OF BEING LOCKED UNTIL A PROXIMITY SENSOR SENSES PROXIMITY FROM A PERFORMANCE TEST COMPLETION WHEN AN ELECTRONIC PART IN WHICH A PERFORMANCE IS TESTED IS A DEFECTIVE PRODUCT
PURPOSE: An electronic component test device and an operating method thereof are provided to prevent from positioning an electronic component which an operator tests as a defective product to a place except a defective product position by a mistake.;CONSTITUTION: An electronic component test device comprises a performance test device (4) and a proximity sensor (8). The performance test device applies a current to an electronic component, and inspects a performance of the electronic component from an output of the electronic component. The performance test device is locked until the proximity sensor senses proximity from a performance test completion when the electronic component in which a performance is tested is a defective product. After being locked, the performance test device is un-locked when the proximity sensor senses the proximity. The proximity sensor is arranged in a defective product position (6) for positioning the electronic component tested as the defective product.;COPYRIGHT KIPO 2013
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