首页> 外国专利> COMPOSITION FOR FORMING A SILICON CONTAINING RESIST UNDERLAYER AND A PATTERN FORMING METHOD CAPABLE OF PRECISELY TRANSFERRING PATTERNS ON A SUBSTRATE BY SUPPRESSING THE TRANSFORMATION OF AN UPPER RESIST PATTERN WHILE DRY-ETCHING

COMPOSITION FOR FORMING A SILICON CONTAINING RESIST UNDERLAYER AND A PATTERN FORMING METHOD CAPABLE OF PRECISELY TRANSFERRING PATTERNS ON A SUBSTRATE BY SUPPRESSING THE TRANSFORMATION OF AN UPPER RESIST PATTERN WHILE DRY-ETCHING

机译:通过抑制干刻蚀时上方抗蚀剂图案的转变而形成能够在基材上精确转移图案的含硅抗蚀剂衬层的组合物和图案形成方法

摘要

PURPOSE: A composition for forming a silicon containing resist underlayer and a pattern forming method are provided to be applied to resist patterns formed by hydrophilic organic compound obtained from negative development and hydrophobic compound obtained from existing positive development.;CONSTITUTION: A composition for forming a silicon containing resist underlayer includes a condensate of a mixture, a hydrolyzed condensate, or both of the condensates containing one or more compound selected from an organic boron compound represented by chemical formula 1 and the condensate of the same and one or more silicon compound represented by chemical formula 2.;COPYRIGHT KIPO 2013
机译:目的:提供一种用于形成含硅抗蚀剂下层的组合物和图案形成方法,以应用于由负显影获得的亲水性有机化合物和现有正显影获得的疏水性化合物形成的抗蚀剂图案。含硅抗蚀剂下层包括混合物的冷凝物,水解的冷凝物,或包含一种或多种选自化学式1表示的有机硼化合物的化合物的冷凝物,以及它们的冷凝物和由以下化学式1表示的一种或多种硅化合物的冷凝物:化学式2.; COPYRIGHT KIPO 2013

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号