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Alignment adjusting mechanism and measuring instrument

机译:对准调整机构及测量仪器

摘要

An alignment mechanism (10) includes: an adjusting plate (40) having first and second adjustment ends parallel to an X axis direction; a probe fixing portion (60) provided to the adjusting plate (40); a probe (8) fixed to the probe fixing portion (60); a reinforcing plate (30) having first and second base ends parallel to the X axis direction, displacement of the reinforcing portion in a Y axis direction being restricted; Y-direction adjusting screws (70) for pressing the adjusting plate (40) in the Y axis direction; and adjustment connectors (521) for respectively connecting the first adjustment end with the first base end and the second adjustment end with the second base end. A stylus (8C) of the probe (8) is disposed on a line of intersection of a first inclined surface including the first adjustment end and the first base end and a second inclined surface including the second adjustment end and the second base end.
机译:对准机构(10)包括:调节板(40),其具有与X轴方向平行的第一和第二调节端。在调整板(40)上设有探针固定部(60)。探针(8)固定在探针固定部(60)上。一加强板(30),其第一和第二基端平行于X轴方向,限制了加强部在Y轴方向上的位移。 Y方向调节螺钉(70),用于沿Y轴方向按压调节板(40);调节连接器(521),其分别将第一调节端与第一基端和第二调节端与第二基端连接。探针(8)的触针(8C)设置在包括第一调节端和第一基端的第一倾斜表面和包括第二调节端和第二基端的第二倾斜表面的相交线上。

著录项

  • 公开/公告号EP2259014A3

    专利类型

  • 公开/公告日2012-11-14

    原文格式PDF

  • 申请/专利权人 MITUTOYO CORPORATION;

    申请/专利号EP20100163883

  • 发明设计人 YAMAMOTO TAKESHI;KAWABATA TAKESHI;

    申请日2010-05-26

  • 分类号G01B21/04;G01B5/012;G01B7/012;

  • 国家 EP

  • 入库时间 2022-08-21 16:33:52

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