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TEST DESIGN MEANS SELECTION DEVICE AND TEST DESIGN MEANS SELECTION METHOD
TEST DESIGN MEANS SELECTION DEVICE AND TEST DESIGN MEANS SELECTION METHOD
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机译：试验设计手段的选择装置及试验设计手段的选择方法
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摘要
PROBLEM TO BE SOLVED: To provide a test design means selection device and a test design means selection method for appropriately selecting a test design which can maximize the benefit gained through design and manufacturing of LSI.;SOLUTION: As test designs influence four items which are the chip area, test execution time, test pattern generation time and fault coverage of LSI, relations among the four items are modeled with regard to three test designs which are a full-scan (FS) design, a built-in self-test (BIST) design, and a test data compression/decompression (EDT) design. With this model, trade-offs for each test design are understood, costs of design and manufacturing appropriate for the design and manufacturing environment are presented, and as a result an appropriate test design (the DFT method and parameters thereof) is easily selected at an early stage of the LSI design flow. By using this test model, a test design can be appropriately selected according to several design and manufacturing environments.;COPYRIGHT: (C)2013,JPO&INPIT
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