首页> 外国专利> SEMI-INSULATING NITRIDE SEMICONDUCTOR WAFER, SEMI-INSULATING NITRIDE SEMICONDUCTOR SELF-SUPPORTING SUBSTRATE AND TRANSISTOR, AND METHOD AND APPARATUS FOR GROWING SEMI-INSULATING NITRIDE SEMICONDUCTOR LAYER

SEMI-INSULATING NITRIDE SEMICONDUCTOR WAFER, SEMI-INSULATING NITRIDE SEMICONDUCTOR SELF-SUPPORTING SUBSTRATE AND TRANSISTOR, AND METHOD AND APPARATUS FOR GROWING SEMI-INSULATING NITRIDE SEMICONDUCTOR LAYER

机译:半绝缘氮化物晶片,半绝缘氮化物自支撑基体和晶体管,以及生长半绝缘氮化物半导体层的方法和装置

摘要

PROBLEM TO BE SOLVED: To provide a semi-insulating nitride semiconductor wafer, having high resistivity (e.g., ≥1×105 Ωcm to ≤1×1012 Ωcm), good uniformity of resistivity (e.g., dispersion of resistivity at positions in an inner peripheral side of wafer corresponding to 80% of surface area of the wafer is within ±30%), and good crystallinity (e.g., a half-value width of X-ray (004) diffraction is 30-300 sec); a semi-insulating nitride semiconductor self-supporting substrate and a transistor, and a method and an apparatus for growing a semi-insulating nitride semiconductor layer.;SOLUTION: This method for growing the nitride semiconductor layer comprises: supplying GaCl of group III raw material continuously or intermittently on a substrate; and also supplying NH3 of nitrogen raw material and Cp2Fe of semi-insulating dopant raw material imparting semi-insulating property alternately to grow the semi-insulating nitride semiconductor layer on the substrate.;COPYRIGHT: (C)2013,JPO&INPIT
机译:要解决的问题:提供一种具有高电阻率(例如,≥1×10 5 Ωcm至≤1×10 12 Ωcm)的半绝缘氮化物半导体晶片,良好的电阻率均匀性(例如,对应于晶片表面积80%的晶片内周侧位置处的电阻率偏差在±30%以内)和良好的结晶度(例如X-的半值宽度射线(004)的衍射时间为30-300秒);半绝缘的氮化物半导体自支撑衬底和晶体管,以及生长半绝缘的氮化物半导体层的方法和设备。连续或间歇地在基材上;并同时提供氮原料的NH 3 和半绝缘掺杂剂原料的Cp 2 Fe交替赋予半绝缘性能,以在其上生长半绝缘氮化物半导体层。基材;版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2012246195A

    专利类型

  • 公开/公告日2012-12-13

    原文格式PDF

  • 申请/专利权人 HITACHI CABLE LTD;

    申请/专利号JP20110120898

  • 发明设计人 FUJIKURA TSUNEAKI;

    申请日2011-05-30

  • 分类号C30B29/38;H01L21/205;H01L21/338;H01L29/778;H01L29/812;

  • 国家 JP

  • 入库时间 2022-08-21 17:01:50

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