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FAULT LOCATION DIAGNOSIS DEVICE, FAULT LOCATION DIAGNOSIS METHOD, AND PROGRAM
FAULT LOCATION DIAGNOSIS DEVICE, FAULT LOCATION DIAGNOSIS METHOD, AND PROGRAM
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机译：故障定位诊断装置，故障定位诊断方法及程序
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摘要
PROBLEM TO BE SOLVED: To provide a fault location diagnosis device which extracts a fault classified as a systematic fault from a test result of a semiconductor integrated circuit that is determined to be defective, thereby facilitating feedback to a manufacturing process.;SOLUTION: A fault location diagnosis device includes: a layout characteristic retrieval area calculation unit that calculates a plurality of layout characteristic retrieval areas having each of a plurality of single fault, which are included in multiple faults, as a base point; a layout characteristic extraction unit that extracts a predetermined characteristic as a layout characteristic from constituents that are included in the plurality of layout characteristic retrieval areas; and a fault type determination unit that determines that a systematic fault exists in a semiconductor integrated circuit under test if a layout characteristic common to the plurality of layout characteristic retrieval areas exists.;COPYRIGHT: (C)2014,JPO&INPIT
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