首页> 外国专利> INFRARED TEMPERATURE MEASUREMENT DEVICE, INFRARED TEMPERATURE MEASUREMENT METHOD, AND INFRARED TEMPERATURE MEASUREMENT DEVICE CONTROL PROGRAM

INFRARED TEMPERATURE MEASUREMENT DEVICE, INFRARED TEMPERATURE MEASUREMENT METHOD, AND INFRARED TEMPERATURE MEASUREMENT DEVICE CONTROL PROGRAM

机译：红外温度测量装置，红外温度测量方法和红外温度测量装置控制程序

页面导航

摘要
著录项
相似文献

摘要

PROBLEM TO BE SOLVED: To provide an infrared temperature measurement device for measuring temperature, and permitting more precise determination of presence of a heat generator.;SOLUTION: An infrared temperature sensor unit 3 receives infrared rays emitted from an object present in a measurement target region, and measures temperature (a measured temperature value) in the measurement target region. A distance operation part 22 measures the distance to the object present in the measurement target region. A temperature correction part 23 corrects the measured temperature value on the basis of the distance, thereby calculating a corrected temperature value.;COPYRIGHT: (C)2014,JPO&INPIT

著录项

公开/公告号JP2013200137A

专利类型
公开/公告日2013-10-03

原文格式PDF
申请/专利权人 OMRON CORP;
展开▼

申请/专利号JP20120067115
发明设计人 SHIIKI MASAKAZU;UEDA NAOTSUGU;NAKAMURA TAKASHI;
展开▼

申请日2012-03-23
分类号G01J5/48;G01K3/06;G01K7/00;
国家 JP
入库时间 2022-08-21 17:02:39

相似文献

专利
外文文献
中文文献