首页> 外国专利> METHOD FOR FABRICATING ULTRA-HIGH RELIABLE MICRO-ELECTRONIC PACKAGE AND MICRO-ELECTRONIC PACKAGE FABRICATED USING THEREOF

METHOD FOR FABRICATING ULTRA-HIGH RELIABLE MICRO-ELECTRONIC PACKAGE AND MICRO-ELECTRONIC PACKAGE FABRICATED USING THEREOF

机译:制造超高可靠性的微电子封装的方法和使用该封装制造的微电子封装

摘要

The invention microelectronic package manufacturing method and a microelectronic package having a high reliability is manufactured by using this relates, in microelectronic package (Micro-electronic Package) manufacturing method according to the present invention in the core substrate and the resin layer are stacked microelectronic package manufacturing method, the resin layer to the core substrate (Core Substrate) with the same material but forming the core substrate is an epoxy substrate (Epoxy Core), accordingly the epoxy resin (Epoxy) as forming material, and optionally a mechanical removal process to pattern the resin layer and the composite method using Huaxia enemy ablative but processed in such a way, the mechanical removal method is characterized in that it comprises a turbulent jet treatment (Jet-Turbulent Treatment), and the chemical reduction method is related to the invention comprising the permanganate process (Permanganate Treatment) . ;
机译:与此相关联,本发明的微电子封装件的制造方法和可靠性高的微电子封装件的制造方法,是在本发明的微电子封装件(微电子封装件)的制造方法中,在芯基板和树脂层上层叠微电子封装件的制造。方法,以相同的材料到核心基板(Core Substrate)形成核心基板的树脂层是环氧树脂基板(Epoxy Core),相应地,环氧树脂(Epoxy)作为形成材料,并可选地通过机械去除工艺进行图案化树脂层及使用华夏敌方烧蚀剂但以这种方式处理的复合方法,其机械去除方法的特征在于,其包括湍流喷射处理(Jet-Turbulent Treatment),化学还原方法与包括高锰酸盐工艺(高锰酸盐处理)。 ;

著录项

  • 公开/公告号KR101109662B1

    专利类型

  • 公开/公告日2012-01-31

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20100018482

  • 发明设计人 권혁천;이효수;이규제;

    申请日2010-03-02

  • 分类号H01L23/12;

  • 国家 KR

  • 入库时间 2022-08-21 17:08:38

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