首页> 外国专利> TEST CHAMBER FOR TESTING AN EMISSION AMOUNT OF A NANO PRODUCT, CAPABLE OF TESTING WHETHER NANO PARTICLES ARE EMITTED TO THE AIR OR NOT AND THE EMISSION AMOUNT

TEST CHAMBER FOR TESTING AN EMISSION AMOUNT OF A NANO PRODUCT, CAPABLE OF TESTING WHETHER NANO PARTICLES ARE EMITTED TO THE AIR OR NOT AND THE EMISSION AMOUNT

机译:用于测试纳米产品排放量的测试室,能够测试是否将纳米颗粒排放到空气中以及排放量

摘要

PURPOSE: A test chamber for testing an emission amount of a nano product is provided to evaluate possibilities of emitting a nano material being exposed to users in an actual usage environment and utilize a testing result as basic information for designing a safe nano product.;CONSTITUTION: A test chamber for testing an emission amount of a nano product comprises a nano product mounting unit, a clean air feeding unit(60), an air discharge port(70), a sampling unit(80), an emitting unit(91). The clean air feeding unit comprises a purge air supplying unit minimizing pollution caused by indoor particles generated when mounting a specimen of a nano product. A speed of an air jet can be changed by changing the diameter of a nozzle in an emission mode by the air jet. A continuous jet or pulse jets of various periods can be utilized by controller a rotation speed of a rotating chopper or an opening/closing period of a solenoid valve in the emission mode by the air jet.;COPYRIGHT KIPO 2013;[Reference numerals] (50) Nano product specimen mounting unit; (61) Clean air supplying device; (62) Flow rate controlling device; (70) Air discharge port; (80) Nano particle sampling unit; (81) Nano particle measuring device and sampler; (91) Air jet oscillation unit; (AA) Vibration; (BB) Impact; (CC) Rubbing
机译:目的:提供一个测试室,用于测试纳米产品的排放量,以评估在实际使用环境中排放暴露给用户的纳米材料的可能性,并将测试结果用作设计安全纳米产品的基本信息。 :用于测试纳米产品的排放量的测试室包括纳米产品安装单元,清洁空气进给单元(60),排气口(70),采样单元(80),发射单元(91)。 。清洁空气供给单元包括吹扫空气供给单元,该吹扫空气供给单元使安装纳米产品的样本时由室内颗粒产生的污染最小化。可以通过在喷射模式下通过空气喷嘴改变喷嘴的直径来改变空气喷嘴的速度。控制器可以通过空气喷射器利用旋转斩波器的旋转速度或电磁阀在排放模式下的打开/关闭时段来使用各种周期的连续喷射或脉冲喷射。; COPYRIGHT KIPO 2013; [附图标记]( 50)纳米产品试样安装单元; (61)清洁空气供应装置; (62)流量控制装置; (70)排气口; (80)纳米粒子采样单元; (81)纳米粒子测量装置和采样器; (91)喷气振荡单元; (AA)振动; (BB)影响; (CC)摩擦

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