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SEMICONDUCTOR DEVICE MANUFACTURING METHOD CAPABLE OF STABLY EXPANDING THE LINE WIDTH OF AN OPEN AREA

机译:能够稳定地扩大开放区域的线宽的半导体装置的制造方法

摘要

PURPOSE: A semiconductor device manufacturing method is provided to stably increase the bottom line width of an open area through a surface processing and etching process, thereby preventing an increase of contact resistance due to a reduction of the bottom line width.;CONSTITUTION: An inter-layer insulating film(22) is arranged on a substrate(21). An etching stopping film(24) and separation film(25) are arranged on the inter-layer insulating film. A plurality of open areas(26) is arranged by selectively etching the separation film in order to expose the substrate. A surface processing process is performed with respect to the separation film. The open area is expanded by eliminating the surface processed separation film among the separation film. A conductive film is arranged in the inside of the expanded open area.;COPYRIGHT KIPO 2012
机译:目的:提供一种半导体器件制造方法,以通过表面处理和蚀刻工艺稳定地增加开口区域的底线宽度,从而防止由于底线宽度减小而导致的接触电阻增加。层绝缘膜(22)布置在基板(21)上。蚀刻停止膜(24)和隔离膜(25)布置在层间绝缘膜上。通过选择性地蚀刻分离膜以暴露衬底来布置多个开口区域(26)。对隔离膜进行表面处理。通过消除分离膜中的经表面处理的分离膜来扩大开口面积。导电膜布置在扩展的开放区域内部。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20110131640A

    专利类型

  • 公开/公告日2011-12-07

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20100051180

  • 发明设计人 LEE SANG OH;

    申请日2010-05-31

  • 分类号H01L21/8242;H01L27/108;

  • 国家 KR

  • 入库时间 2022-08-21 17:11:29

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