首页> 外国专利> ABNORMALITY DETECTING DEVICE FOR STORAGE ELEMENT, ABNORMALITY DETECTING METHOD FOR STORAGE ELEMENT, ABNORMALITY DETECTING PROGRAM FOR STORAGE ELEMENT, AND COMPUTER-READABLE RECORDING MEDIUM STORING ABNORMALITY DETECTING PROGRAM

ABNORMALITY DETECTING DEVICE FOR STORAGE ELEMENT, ABNORMALITY DETECTING METHOD FOR STORAGE ELEMENT, ABNORMALITY DETECTING PROGRAM FOR STORAGE ELEMENT, AND COMPUTER-READABLE RECORDING MEDIUM STORING ABNORMALITY DETECTING PROGRAM

机译:存储元件的异常检测装置,存储元件的异常检测方法,存储元件的异常检测程序以及计算机可读介质存储异常检测程序

摘要

An abnormality detecting device for a storage element is able to improve accuracy of abnormality detection for the storage element. The device includes at least an equalization process portion, an abnormality determination portion, a voltage measurement portion, and a control portion. The control portion issues a command to the equalization process portion to start an equalization process in a case where there is a variance in capacity of storage element blocks B1, B2, ... and BN. The abnormality determination portion performs an abnormality determination on the storage element blocks B1, B2, ..., and BN using voltages across the terminals of the respective storage element blocks B1, B2, ..., and BN that have been allowed to stand after an elapse of a predetermined time since the end of the equalization process.
机译:用于存储元件的异常检测装置能够提高用于存储元件的异常检测的准确性。该设备至少包括均衡处理部分,异常确定部分,电压测量部分和控制部分。在存储元件块B1,B2,...和BN的容量存在差异的情况下,控制部分向均衡处理部分发出命令以开始均衡处理。异常确定部使用已经被允许站立的各个存储元件块B1,B2,...和BN的端子之间的电压对存储元件块B1,B2,...和BN执行异常确定。从均衡过程结束起经过预定​​时间之后。

著录项

  • 公开/公告号EP2083494B1

    专利类型

  • 公开/公告日2012-08-08

    原文格式PDF

  • 申请/专利权人 PANASONIC CORPORATION;

    申请/专利号EP20070831072

  • 发明设计人 IIDA TAKUMA;

    申请日2007-11-01

  • 分类号H02J7;H01M10/44;H01M10/48;H02J7/02;H02J7/10;

  • 国家 EP

  • 入库时间 2022-08-21 17:16:33

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号