首页> 外国专利> Abnormality detecting device for storage element, abnormality detecting method for storage element, abnormality detecting program for storage element, and computer-readable recording medium storing abnormality detecting program

Abnormality detecting device for storage element, abnormality detecting method for storage element, abnormality detecting program for storage element, and computer-readable recording medium storing abnormality detecting program

机译:用于存储元件的异常检测装置,用于存储元件的异常检测方法,用于存储元件的异常检测程序以及存储该异常检测程序的计算机可读记录介质

摘要

An abnormality detecting device for a storage element is able to improve accuracy of abnormality detection for the storage element. The device includes at least an equalization process portion, an abnormality determination portion, a voltage measurement portion, and a control portion. The control portion issues a command to the equalization process portion to start an equalization process in a case where there is a variance in capacity of storage element blocks B1, B2, . . . and BN. The abnormality determination portion performs an abnormality determination on the storage element blocks B1, B2, . . . , and BN using voltages across the terminals of the respective storage element blocks B1, B2, . . . , and BN that have been allowed to stand after an elapse of a predetermined time since the end of the equalization process.
机译:用于存储元件的异常检测装置能够提高用于存储元件的异常检测的准确性。该设备至少包括均衡处理部分,异常确定部分,电压测量部分和控制部分。在存储元件块B 1 ,B 2 ,...的容量存在差异的情况下,控制部向均衡处理部发出命令以开始均衡处理。 。 。 。和国阵。异常确定部分对存储元件块B 1 ,B 2 ,...进行异常确定。 。 。使用各个存储元件块B 1 ,B 2 ,...的端子之间的电压来对BN,BN和BN进行充电。 。 。以及从均衡处理结束以来经过了预定时间之后被允许站立的BN。

著录项

  • 公开/公告号US8085051B2

    专利类型

  • 公开/公告日2011-12-27

    原文格式PDF

  • 申请/专利权人 TAKUMA IIDA;

    申请/专利号US20070513321

  • 发明设计人 TAKUMA IIDA;

    申请日2007-11-01

  • 分类号G01N27/416;

  • 国家 US

  • 入库时间 2022-08-21 17:26:08

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