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METHOD FOR MEASURING SYSTEM PARAMETER OF LINEAR MULTIPORT AND MEASURING METHOD USING VECTOR NETWORK ANALYZER
METHOD FOR MEASURING SYSTEM PARAMETER OF LINEAR MULTIPORT AND MEASURING METHOD USING VECTOR NETWORK ANALYZER
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机译:线性多端口系统参数的测量方法及矢量网络分析仪的测量方法
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摘要
The present invention provides a novel measurement method for system parameters of a 5-port junction used in a VNA (Vector Network Analyzer). A VNA is a device for measuring amplitude ratios and phase differences (S-parameters: scattering matrix elements) between incident waves and reflected waves of a DUT (Device Under Test), or between input waves and transmitted waves. What has been newly discovered is that for 5 ports, S-parameters can be expressed by a linear coupling using H and power difference ratios ({P(S)/P(0)}−1). It is possible to easily calculate parameter H using a minimum of three already known standards, and amount of calculation can be reduced compared to conventionally.
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