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METHOD FOR MEASURING SYSTEM PARAMETER OF LINEAR MULTIPORT AND MEASURING METHOD USING VECTOR NETWORK ANALYZER

机译:线性多端口系统参数的测量方法及矢量网络分析仪的测量方法

摘要

The present invention provides a novel measurement method for system parameters of a 5-port junction used in a VNA (Vector Network Analyzer). A VNA is a device for measuring amplitude ratios and phase differences (S-parameters: scattering matrix elements) between incident waves and reflected waves of a DUT (Device Under Test), or between input waves and transmitted waves. What has been newly discovered is that for 5 ports, S-parameters can be expressed by a linear coupling using H and power difference ratios ({P(S)/P(0)}−1). It is possible to easily calculate parameter H using a minimum of three already known standards, and amount of calculation can be reduced compared to conventionally.
机译:本发明提供了一种用于VNA(矢量网络分析仪)中的5端口结的系统参数的新颖的测量方法。 VNA是一种用于测量DUT(被测设备)的入射波与反射波之间或输入波与透射波之间的振幅比和相位差(S参数:散射矩阵元素)的设备。新发现的是,对于5个端口,可以通过使用H和功率差比({P(S)/ P(0)}-1)的线性耦合来表示S参数。可以使用至少三个已知标准轻松地计算参数H,并且与传统方法相比,可以减少计算量。

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