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METHOD FOR MEASURING SYSTEM PARAMETER OF LINEAR MULTIPORT AND MEASURING METHOD USING VECTOR NETWORK ANALYZER

机译:线性多端口系统参数的测量方法及矢量网络分析仪的测量方法

摘要

Provided is a novel method for measuring a system parameter of five-port junction used for a VNA (Vector Network Analyzer). The VNA is a device for measuring the incident wave and reflected wave of a DUT (Device Under Test), or the amplitude ratio of the incident wave to the transparent wave and the phase difference (S parameter: scattering matrix element) between the incident wave and the transparent wave thereof. As new findings, it has been found out that the S parameter can be represented by linear coupling using an H and a power difference ratio ({P(S)/P(0)}-1) in the five-port junction. The parameter (H) can be easily derived by calculation using at least three pieces of known standards, making it possible to reduce the amount of the calculation more than ever before.
机译:提供了一种用于测量VNA(矢量网络分析仪)的五端口结的系统参数的新颖方法。 VNA是用于测量DUT的入射波和反射波(被测器件)或入射波与透明波的振幅比以及入射波之间的相位差(S参数:散射矩阵元素)的设备。及其透明波。作为新发现,已经发现可以通过在五端口结中使用H和功率差比({P(S)/ P(0)}-1)进行线性耦合来表示S参数。通过使用至少三种已知标准通过计算可以容易地推导出参数(H),从而可以比以往减少更多的计算量。

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