首页> 外国专利> SYSTEMS FOR CHROMATIC ABERRATION CORRECTION IN TOTAL INTERNAL REFLECTION FLUORESCENCE MICROSCOPY

SYSTEMS FOR CHROMATIC ABERRATION CORRECTION IN TOTAL INTERNAL REFLECTION FLUORESCENCE MICROSCOPY

机译:总内反射荧光显微镜中的色差校正系统

摘要

Correction elements that can be incorporated in objective-based TIRF microscopy instruments to correct for chromatic aberrations are described. A correction element can be placed between a multiple wavelength excitation beam source and the microscope objective lens. In one aspect, the thickness of the correction element is defined to compensate for different axial positions of the focal points associated with each excitation wavelengths traveling along the outer edge of lenses comprising a microscope objective lens. In another aspect, the correction element can be angled and/or configured so that the different wavelengths of multiple wavelength excitation light are shifted to adjust the angle of incidence for each wavelength at the specimen/substrate interface.
机译:描述了可以结合在基于物镜的TIRF显微镜仪器中以校正色差的校正元件。可以在多波长激发光束源和显微镜物镜之间放置校正元件。一方面,校正元件的厚度被限定为补偿与沿着包括显微镜物镜的透镜的外边缘行进的每个激发波长相关联的焦点的不同轴向位置。在另一方面,校正元件可以被成角度和/或被配置为使得多个波长激发光的不同波长被移位以针对样本/基板界面处的每个波长来调节入射角。

著录项

  • 公开/公告号US2012176672A1

    专利类型

  • 公开/公告日2012-07-12

    原文格式PDF

  • 申请/专利权人 JEREMY R. COOPER;

    申请/专利号US201113338664

  • 发明设计人 JEREMY R. COOPER;

    申请日2011-12-28

  • 分类号G02B21/08;

  • 国家 US

  • 入库时间 2022-08-21 17:35:02

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