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As the substrate which sticks the thin film sample with respect to Seebeck coefficient of the thin film sample and

机译:作为相对于薄膜样品的塞贝克系数粘附薄膜样品的基板,

摘要

PROBLEM TO BE SOLVED: To solve the problem, wherein a simple method and apparatus capable of efficiently measuring the Seebeck coefficient and thermal conductivity of a thermoelectric conversion element (membrane), at the same time, have not been available.;SOLUTION: A substrate 2, on which a membrane sample 1 is pasted, is placed on a heater block 1; the pasted side of the membrane sample 1 of the substrate 2 is further covered with a transparent hood 4, and these structures are integrally held in a substantially vertical state, and by carrying out air blowing 5 to the surface of the hood to form a temperature difference between the side surface of the hood (the front surface of the sample) of the membrane sample 1 and the side surface of the substrate (the rear surface of the sample); and the Seebeck coefficient or the thermal conductivity is measured, on the basis of the temperature difference.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:为了解决该问题,其中还没有一种能够同时有效地测量热电转换元件(膜)的塞贝克系数和热导率的简单方法和装置。如图2所示,将粘贴有膜样品1的膜放置在加热块1上。基板2的膜样品1的粘贴面进一步被透明罩4覆盖,这些结构以大致垂直的状态一体地保持,并且通过向罩的表面吹气5而形成温度。膜样品1的罩的侧面(样品的正面)与基材的侧面(样品的背面)之差; ;并根据温度差测量塞贝克系数或导热系数。;版权所有:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP5062753B2

    专利类型

  • 公开/公告日2012-10-31

    原文格式PDF

  • 申请/专利权人 公立大学法人大阪府立大学;

    申请/专利号JP20080053026

  • 发明设计人 津久井 茂樹;

    申请日2008-03-04

  • 分类号G01N25/00;G01N25/18;

  • 国家 JP

  • 入库时间 2022-08-21 17:39:43

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