首页> 外国专利> The three-dimensional shape measuring apparatus according to the pattern projection method, method and program

The three-dimensional shape measuring apparatus according to the pattern projection method, method and program

机译:根据图案投影方法的三维形状测量设备,方法和程序

摘要

By the present invention, using the fact that the cross ratio of the phases are measured relative to the measurement object point and the reference data points, and the cross ratio of the depth distance for points are equal, and determine the depth distance of the measurement object point I could. Also, during the image projection point cloud is that the present invention, the reference data points and was projected onto the image cross ratio of the distance between the projected point cloud which is projected to the standard reference plane measurement object point, the projection point group by using the fact that each of the compound ratio of the distance of the point cloud between the equal phase, equal to the cross ratio of the depth distance cross ratio of the distance, the image projected point cloud of the straight line of any image, I seek the depth distance of points of interest.
机译:通过本发明,利用以下事实:相对于测量对象点和参考数据点测量相的交叉比率,并且各点的深度距离的交叉比率相等,并确定测量的深度距离。我可以。另外,在本发明的图像投影点云期间,将基准数据点投影到投影到标准基准平面测量对象点的投影点云与投影点组之间的距离的图像交叉比率上。通过利用以下事实:每个相点之间的距离的复合比率相等,等于深度距离的交叉比率等于交叉距离的交叉比率,图像投影点云的任何图像的直线,我寻找兴趣点的深度距离。

著录项

  • 公开/公告号JP5029618B2

    专利类型

  • 公开/公告日2012-09-19

    原文格式PDF

  • 申请/专利权人 日本電気株式会社;

    申请/专利号JP20080551117

  • 发明设计人 石山 塁;

    申请日2007-12-25

  • 分类号G01B11/25;G01C3/06;

  • 国家 JP

  • 入库时间 2022-08-21 17:40:38

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号