首页> 外国专利> Integrated electronic device, particularly embedded micro controller system, has load detection stage, which is designed such that it generates alternating input voltage, which is applied on contact point of integrated electronic device

Integrated electronic device, particularly embedded micro controller system, has load detection stage, which is designed such that it generates alternating input voltage, which is applied on contact point of integrated electronic device

机译:集成电子设备,特别是嵌入式微控制器系统,具有负载检测级,该负载检测级被设计为生成交流输入电压,该电压施加在集成电子设备的触点上

摘要

The integrated electronic device has a load detection stage, which is designed such that it generates an alternating input voltage, which is applied on a contact point (P) of the integrated electronic device. The input voltage has two flanks and a predetermined time period between the two flanks. The load detection stage is designed such that it monitors whether the voltage level at the contact point exceeds a threshold value in response to the input voltage, and provides a corresponding output signal. An independent claim is also included for a method for detecting a capacitive load at a contact point of an integrated electronic device.
机译:集成电子设备具有负载检测级,该负载检测级被设计为使得它生成交流输入电压,该交流输入电压施加在集成电子设备的触点(P)上。输入电压具有两个侧面和两个侧面之间的预定时间段。负载检测级被设计为使得其响应于输入电压来监控接触点处的电压电平是否超过阈值,并提供相应的输出信号。还包括用于检测集成电子设备的接触点处的电容性负载的方法的独立权利要求。

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