System and method to screen defect related reliability failures in CMOS SRAMS

• 1. 在数据存取之前对静态随机存取存储器(SRAM)中的位线进行预充电以减少泄漏功率，以及相关系统和方法 [P] . 中国专利： CN105190759A . 2015-12-23
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• 3. System and method to screen defect related reliability failures in CMOS SRAMS [P] . 美国专利： US6950355B2 . 2005-09-27

  机译： 在CMOS sram中筛选与缺陷相关的可靠性故障的系统和方法

• 4. System and method to screen defect related reliability failures in CMOS SRAMS [P] . 欧洲知识产权局专利： EP1284498A2 . 2003-02-19

  机译： 在CMOS sram中筛选与缺陷相关的可靠性故障的系统和方法

• 5. System and method to screen defect related reliability failures in CMOS SRAMS [P] . 美国专利： US2003036231A1 . 2003-02-20

  机译： 在CMOS sram中筛选与缺陷相关的可靠性故障的系统和方法

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