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System and method to determine chromatic dispersion in short lengths of waveguides using a common path interferometer

机译:使用公共路径干涉仪确定短波长波导中色散的系统和方法

摘要

The present invention relates to a system and method to determine chromatic dispersion in short lengths of waveguides using a two wave interference pattern and a common path interferometer. Specifically the invention comprises a radiation source operable to emit radiation connected to a means for separating incident and reflected waves; the means for separating incident and reflected waves possessing an output arm adjacent to a first end of the waveguide; and the means for separating incident and reflected waves further connected to an optical detector operable to record an interference pattern generated by a reflected test emission from the radiation source. The interference pattern consists of two waves: one reflected from a first facet of a waveguide and the second reflected from a second facet of the same waveguide.
机译:本发明涉及一种使用两个波干涉图和一个公共路径干涉仪来确定短波长波导中的色散的系统和方法。具体地说,本发明包括一个可发射辐射的辐射源,该辐射源与用于分离入射波和反射波的装置相连。用于分离入射波和反射波的装置,其具有与波导的第一端相邻的输出臂;用于分离入射波和反射波的装置还连接到光学检测器,该光学检测器可操作以记录由来自辐射源的反射测试发射产生的干涉图。干涉图由两个波组成:一个波从波导的第一面反射,第二个波从同一波导的第二面反射。

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