首页> 外国专利> CONFIGURATION OF A LASER SCANNING MICROSCOPE FOR RASTER IMAGE CORRELATION SPECTROSCOPY MEASUREMENT AND METHOD FOR CONDUCTING AND EVALUATING SUCH A MEASUREMENT

CONFIGURATION OF A LASER SCANNING MICROSCOPE FOR RASTER IMAGE CORRELATION SPECTROSCOPY MEASUREMENT AND METHOD FOR CONDUCTING AND EVALUATING SUCH A MEASUREMENT

机译:用于光栅图像相关光谱测量的激光扫描显微镜的配置以及进行和评估这种测量的方法

摘要

1.1. Method for the configuration a laser scanning microscope for a raster image correlation spectroscopy measurement and method for carrying out and evaluating a measurement of this kind. 2.1. Manual setting of the scan parameters for a raster image correlation spectroscopy measurement (RICS) is complicated because the effects of setting a certain parameter are not apparent due to the complex interaction between the various parameters and also depend on the physical-technical properties of the microscope. By means of an improved configuration method, mathematical transport models can be fitted to correlations determined by means of scanning fluorescence spectroscopy with few errors. With improved methods for carrying out or evaluating a RICS measurement, the amount of data to be stored can be reduced and RICS correlations of high statistical quality can be determined within a short period of time. 2.2. According to the invention, for a raster image correlation spectroscopy measurement, a best value for a sampling value is determined and is specified for a subsequent scanning process on a sample. In order to carry out or evaluate a RICS measurement, sampling values are acquired or a correlation is determined exclusively in a sample region within which a pixel time (ΔP) changes along a harmonically controlled scan axis (X) by less than, or at most by, a predetermined or predeterminable value. 2.3. The invention is preferably used in laser scanning microscopes.
机译:1.1。构造用于光栅图像相关光谱测量的激光扫描显微镜的方法以及用于执行和评估这种测量的方法。 2.1。手动设置光栅图像相关光谱测量(RICS)的扫描参数很复杂,因为由于各种参数之间的复杂相互作用,设置特定参数的效果并不明显,并且还取决于显微镜的物理技术特性。通过改进的配置方法,可以将数学传输模型拟合到利用扫描荧光光谱法确定的相关性上,而几乎没有错误。通过用于执行或评估RICS测量的改进方法,可以减少要存储的数据量,并且可以在短时间内确定高统计质量的RICS相关性。 2.2。根据本发明,对于光栅图像相关光谱测量,确定采样值的最佳值,并为随后对样品的扫描过程指定最佳值。为了执行或评估RICS测量,仅在采样区域中获取采样值或确定相关性,在该采样区域中,像素时间(ΔP)沿谐波控制的扫描轴(X)的变化小于或最大。通过预定或预定值。 2.3。本发明优选用于激光扫描显微镜。

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