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Electronic component test equipment, test methods of electronic components and electronic component testing system
Electronic component test equipment, test methods of electronic components and electronic component testing system
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机译:电子元器件测试设备,电子元器件测试方法及电子元器件测试系统
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摘要
Immediately before the testing of the IC device, it is inverted by overlapping and (5) contact plate of the test only and (6A) customer tray, a customer tray (5) contact plates electronic device testing apparatus and (6A) When the reversing device of the first and transferring the IC device (220), to test the IC device, while holding the IC device contact plate (6A), socket test head (4) (41) The IC device and a pressing device for pressing in and a (250).
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