首页> 外国专利> Electrochemical etching of macropores in n-type silicon wafers under illumination of backside of the wafer using an aqueous electrolyte, where the electrolyte is an aqueous acetic acid solution of a composition with hydrogen fluoride

Electrochemical etching of macropores in n-type silicon wafers under illumination of backside of the wafer using an aqueous electrolyte, where the electrolyte is an aqueous acetic acid solution of a composition with hydrogen fluoride

机译:使用含水电解质在晶片背面的照射下对n型硅晶片中的大孔进行电化学蚀刻,其中电解质是具有氟化氢成分的醋酸水溶液

摘要

Electrochemical etching of macropores in n-type silicon wafers under illumination of wafer's rear side by use of an aqueous electrolyte, is claimed, where the electrolyte is an aqueous acetic acid solution of a composition comprising water:acetic acid in a ratio of 2:1 and 7:3 with a mixture of at least 9 wt.% of hydrogen fluoride.
机译:要求保护的n型硅晶片中的大孔在晶片背面的照射下通过使用水性电解质进行电化学蚀刻,其中电解质是乙酸:水溶液的组合物,其包含水:乙酸的比例为2∶1 7:3和至少9 wt。%氟化氢的混合物。

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