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CONTROL OF ELECTROMECHANICAL BEHAVIOUR OF STRUCTURES IN DEVICE OF MICRO-ELECTROMECHANICAL SYSTEMS

机译:微机电系统中设备的机电行为控制

摘要

FIELD: physics, optics.;SUBSTANCE: invention is related to thin-film structures in devices of micro-electromechanical systems and to electromechanical and optical responses of this thin-film structures. Device of micro-electromechanical systems (MEMS) comprises substrate, electrostatically displaced layer, electrode placed on substrate, air gap is located between electrode and displaced layer, layer of electric charges catching comprising material that is able to catch both positive and negative charges, transparent layer formed between layer of electric charges catching and electrode. Another two versions of MEMS device are also suggested, as well as two versions of MEMS manufacture.;EFFECT: provision of improved characteristic (electromechanical) response.;22 cl, 9 dwg
机译:技术领域本发明涉及微机电系统的装置中的薄膜结构,并且涉及该薄膜结构的机电和光学响应。微机电系统(MEMS)的设备包括衬底,静电位移层,放置在衬底上的电极,位于电极与位移层之间的气隙,电荷捕获层,包括能够捕获正负电荷的材料,透明在电荷捕获层和电极之间形成的层。还建议了另外两种版本的MEMS器件,以及两种版本的MEMS制造。效果:提供改进的特性(机电)响应。22 cl,9 dwg

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