首页> 外国专利> SILICON-BASED NANOWIRE HAVING LOW CONTACT RESISTANCE AND METHOD FOR MANUFACTURING THE SAME

SILICON-BASED NANOWIRE HAVING LOW CONTACT RESISTANCE AND METHOD FOR MANUFACTURING THE SAME

机译:具有低接触电阻的基于硅的纳米线及其制造方法

摘要

A manufacturing method of base contact resistance silicon nano wire is provided to be contacted when metal wiring and nano wire are joined in case that a transistor other device is made by using the nano wire. A manufacturing method of base contact resistance silicon nano wire comprises steps of: preparing silicon or silicon-germanium nano wire(50); laminating radially a metallic foil(60) at a surface of the nano wire by a sputtering or a method for atomic layer deposition; forming a metal-silicide layer(70) through a thermal process; and removing metal which does not participate in reaction through wet etching.
机译:提供一种基极接触电阻硅纳米线的制造方法,以在使用纳米线制造晶体管其他器件的情况下,当金属布线和纳米线接合时接触。基极接触电阻硅纳米线的制造方法包括以下步骤:制备硅或硅锗纳米线(50);通过溅射或原子层沉积的方法在纳米线的表面上径向地层压金属箔(60);通过热处理形成金属硅化物层(70);通过湿法蚀刻除去不参与反应的金属。

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