Scanning probe apparatus with in-situ measurement probe tip cleaning capability

• 1. 具有电阻尖端的半导体探针及其制作方法、和具有该半导体探针的信息记录装置、信息复制装置和信息测量装置 [P] . 中国专利： CN100568478C . 2009.12.09
• 2. 具有电阻尖端的半导体探针及其制作方法、和具有该半导体探针的信息记录装置、信息复制装置和信息测量装置 [P] . 中国专利： CN1653605A . 2005-08-10
• 3. SCANNING PROBE APPARATUS WITH IN-SITU MEASUREMENT PROBE TIP CLEANING CAPABILITY [P] . 美国专利： US2008223118A1 . 2008-09-18

  机译： 具有原位测量探针尖端清洁能力的扫描探针装置

• 4. FIXTURE FOR SENSOR UNIT OF SCANNING MEASUREMENT PROBE, SENSOR UNIT OF SCANNING MEASUREMENT PROBE, SCANNING PROBE MICROSCOPE AND METHOD TO INSTALL AND REMOVE SENSOR UNIT OF SCANNING MEASUREMENT PROBE [P] . 俄罗斯专利： RU2572287C2 . 2016-01-10

  机译： 扫描测量探头的传感器装置，扫描测量探头的传感器单元，扫描探头显微镜以及安装和拆卸扫描测量探头的传感器单元的方法

• 5. MEASUREMENT PROBE APPARATUS FOR A PROBE MICROSCOPE, MEASUREMENT CELL AND SCANNING PROBE MICROSCOPE [P] . 世界知识产权组织专利： WO2009012765A2 . 2009-01-29

  机译： 探针显微镜，测量单元和扫描探针显微镜的测量探针装置

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