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Single crystal GaN substrate, method of growing single crystal GaN and method of producing single crystal GaN substrate

机译:单晶GaN衬底,生长单晶GaN的方法和生产单晶GaN衬底的方法

摘要

A low dislocation density GaN single crystal substrate is made by forming a seed mask having parallel stripes regularly and periodically aligning on an undersubstrate, growing a GaN crystal on a facet-growth condition, forming repetitions of parallel facet hills and facet valleys rooted upon the mask stripes, maintaining the facet hills and facet valleys, producing voluminous defect accumulating regions (H) accompanying the valleys, yielding low dislocation single crystal regions (Z) following the facets, making C-plane growth regions (Y) following flat tops between the facets, gathering dislocations on the facets into the valleys by the action of the growing facets, reducing dislocations in the low dislocation single crystal regions (Z) and the C-plane growth regions (Y), and accumulating the dislocations in cores (S) or interfaces (K) of the voluminous defect accumulating regions (H).
机译:低位错密度的GaN单晶衬底是通过以下方式制成的:在底基板上定期形成规则条纹并平行排列的籽晶掩模,并在刻面生长条件下生长GaN晶体,并重复形成平行的刻面丘陵和刻面凹谷条纹,维持刻面丘陵和刻面凹谷,产生与凹谷相伴的大量缺陷累积区(H),在刻面后产生低位错单晶区(Z),在刻面之间的平顶之后形成C平面生长区(Y) ,通过生长小平面的作用将小平面上的位错聚集到山谷中,减少低位错单晶区(Z)和C平面生长区(Y)中的位错,并在核中累积位错(S)或大量缺陷累积区域(H)的界面(K)。

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