首页> 外国专利> Substrate Including Barrier Solder Bumps to Control Underfill Transgression and Microelectronic Package including Same

Substrate Including Barrier Solder Bumps to Control Underfill Transgression and Microelectronic Package including Same

机译:包括用于控制底部填充侵害的势垒焊料凸块的基板以及包括该基板的微电子封装

摘要

A microelectronic substrate and a microelectronic package including the substrate and a die bonded thereto. The substrate includes a substrate panel having a die-side surface including a die-attach region; a system of interconnects extending through the substrate panel and adapted to allow a connection of the substrate to external circuitry; and a plurality of solder bumps including: die-attach solder bumps electrically coupled to the system of interconnects and disposed in the die-attach region; and barrier solder bumps isolated from the system of interconnects, the barrier solder bumps being disposed outside of the die-attach region and being adapted to substantially limit a flow of underfill away from the die-attach region.
机译:微电子衬底和微电子封装,包括该衬底和结合到其上的管芯。该基板包括:基板面板,该基板面板具有包括管芯附着区域的管芯侧表面;以及设置在管芯表面上的管芯。一种互连系统,其延伸穿过基板面板并且适于允许基板与外部电路的连接;多个焊料凸块,包括:芯片连接焊料凸块,其电连接到互连系统并设置在芯片连接区域中;以及隔离焊料凸块与互连系统隔离,该隔离焊料凸块设置在管芯附接区域的外部,并且适于基本限制底部填充剂离开管芯附接区域的流动。

著录项

  • 公开/公告号US2008315410A1

    专利类型

  • 公开/公告日2008-12-25

    原文格式PDF

  • 申请/专利权人 ALAN E. JOHNSON;

    申请/专利号US20070766262

  • 发明设计人 ALAN E. JOHNSON;

    申请日2007-06-21

  • 分类号H01L23/48;

  • 国家 US

  • 入库时间 2022-08-21 19:33:18

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