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PATENT ANALYZING DEVICE, PATENT ANALYZING METHOD, AND PATENT ANALYZING PROGRAM

机译:专利分析装置,专利分析方法以及专利分析程序

摘要

PROBLEM TO BE SOLVED: To solve the problem that it may be impossible to decide whether a predetermined applicant regards as important a prescribed technical items to which attention is paid by an analyzer.;SOLUTION: A patent analyzing device is provided with: a first calculation part for calculating a first ratio of the total number of patent applications applied by a predetermined applicant, which is extracted from a first population of application patents, to the total number of applications of the first population; a second calculation part for calculating a second ratio of the number of patent applications applied by the predetermined applicant to the total number of applications in a second population of the application patents having predetermined technical items extracted from the first population; and a ratio calculation part for calculating the ratio of the second rate to the first rate.;COPYRIGHT: (C)2010,JPO&INPIT
机译:要解决的问题:解决可能无法确定预定申请人是否将分析仪关注的规定技术项目视为重要的问题。解决方案:专利分析装置具有:第一次计算用于计算从第一批申请专利中提取的预定申请人申请的专利总数的第一比率与第一批申请总数的比率;第二计算部分,用于计算预定申请人的专利申请数量与第二群体中具有从第一群体中提取的预定技术项目的第二总申请数量的比率; COPYRIGHT:(C)2010,JPO&INPIT;比率计算部分,用于计算第二比率与第一比率的比率。

著录项

  • 公开/公告号JP2009258944A

    专利类型

  • 公开/公告日2009-11-05

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20080106463

  • 发明设计人 MOGI HIROYUKI;YUDASAKA KAZUO;

    申请日2008-04-16

  • 分类号G06Q50/00;

  • 国家 JP

  • 入库时间 2022-08-21 19:44:17

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