首页> 外国专利> Measuring arrangement i.e. polarimetric measuring device, for measuring polarization-affecting characteristics of e.g. biconvex lens, has detector and/or light source units which are changeable in alignment relative to optical component

Measuring arrangement i.e. polarimetric measuring device, for measuring polarization-affecting characteristics of e.g. biconvex lens, has detector and/or light source units which are changeable in alignment relative to optical component

机译：测量装置，即偏振测量装置，用于测量例如偏振光的偏振影响特性。双凸透镜，具有检测器和/或光源单元，它们相对于光学组件的对齐方式可以更改

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摘要

The arrangement i.e. device has a light source unit, which emits measuring light radiations, and a detector unit, which detects a polarization condition of the radiations. The source and the detector units are arranged such that the radiations pass through a refractive optical component e.g. biconvex lens, before touching the detector unit. A distance between the detector unit and the component and/or a distance between the source unit and the component is changeable, where the detector and/or the light source units are changeable in alignment relative to the component. An independent claim is also included for a method for determining the polarization-affecting characteristics of a refractive optical component, in particular a lens.

机译：该装置即装置具有发出测量光辐射的光源单元和检测辐射的偏振状态的检测器单元。布置源和检测器单元，使得辐射穿过折射光学组件，例如，光学组件。双凸透镜，然后触摸检测器单元。检测器单元和部件之间的距离和/或源单元和部件之间的距离是可改变的，其中检测器和/或光源单元相对于部件的对准是可改变的。还包括用于确定折射光学部件，特别是透镜的偏振影响特性的方法的独立权利要求。

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公开/公告号DE102006031006A1

专利类型
公开/公告日2007-11-15

原文格式PDF
申请/专利权人 CARL ZEISS SMT AG;
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申请/专利号DE20061031006
发明设计人 OCHSE ANDREAS;SPANUTH JENS;BAUMSTARK HELGE;
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申请日2006-07-05
分类号G01N21/21;G01J4;G01J4/04;G01M11/02;
国家 DE
入库时间 2022-08-21 19:49:55

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