首页> 外国专利> FINAL POLISHING PROCESS FOR SILICON SINGLE CRYSTAL WAFER AND SILICON SINGLE CRYSTAL WAFER

FINAL POLISHING PROCESS FOR SILICON SINGLE CRYSTAL WAFER AND SILICON SINGLE CRYSTAL WAFER

机译:硅单晶硅片和硅单晶硅片的最终抛光工艺

摘要

Disclosed is a final polishing process for a silicon single crystal wafer as the final polishing step among a plurality of polishing steps wherein a silicon single crystal wafer is polished while having a polishing slurry intervene between the silicon single crystal wafer and a polishing cloth. In this final polishing process for a silicon single crystal wafer, the polishing rate is set at not more than 10 nm/min. Also disclosed is a silicon single crystal wafer polished by such a final polishing process. This final polishing process enables to obtain a silicon single crystal wafer which is reduced in PID (Polishing Induced Defects).
机译:公开了作为多个抛光步骤中的最终抛光步骤的单晶硅晶片的最终抛光工艺,其中在单晶硅晶片和抛光布之间插入抛光浆的同时抛光单晶硅晶片。在该单晶硅晶片的最终抛光过程中,抛光速率设置为不大于10 nm / min。还公开了通过这种最终抛光工艺抛光的硅单晶晶片。该最终的抛光过程使得能够获得单晶硅晶片,其PID(抛光引起的缺陷)减少了。

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